Atomic-Force Microscope (AFM 5500 Agilent/Nano observer CSI Instruments)
What we can offer:
Reliable and replicable high-quality topography and magnetic images with the highest nanoscale resolution at up to 250 ºC and in-situ magnetic field.
Topographical analysis of a wide variety of materials with nanoscale lateral resolution and sub-nm height resolution.
Interesting for (with the system):
Material science, biology, pharmaceutics…
Topography Nanoscale AFM height profile