Atomic-Force Microscope (AFM 5500 Agilent/Nano observer CSI Instruments)

Atomic-Force Microscope
Atomic-Force Microscope photograph

What we can offer:

Reliable and replicable high-quality topography and magnetic images with the highest nanoscale resolution at up to 250 ºC and in-situ magnetic field.

Possibility:

Topographical analysis of a wide variety of materials with nanoscale lateral resolution and sub-nm height resolution.

Interesting for (with the system):

Material science, biology, pharmaceutics…

Tags
Topography Nanoscale AFM height profile

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