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CIC nanoGUNE

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      • Functional Coatings
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      • Magnetic characterization
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Characterization Platform

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  • Characterization platform
  • Sample-fabrication platform
  • Plasma asher

    Plasma asher

  • Universal mechanical tester (UMT)

    Universal mechanical tester (UMT)

  • Atomic-Force Microscope (AFM 5500 Agilent/Nano observer CSI Instruments)

    Atomic-Force Microscope (AFM 5500 Agilent/Nano observer CSI Instruments)

  • Spectroscopic ellipsometer (GES5 spectroscopic-ellipsometer SEMILAB)

    Spectroscopic ellipsometer (GES5 spectroscopic-ellipsometer SEMILAB)

  • FTIR Spectrometer PerkinElmer Frontier

    FTIR Spectrometer PerkinElmer Frontier

  • Scattering-type near-field microscope (NeaSpec)

    Scattering-type near-field microscope (NeaSpec)

  • Environmental Scanning-electron photograph

    Environmental Scanning-electron Microscope (eSEM-FEI Quanta 250)

  • High-resolution Transmission Electron Microscope photograph

    High-resolution Transmission Electron Microscope (HRTEM)

  • Four point probe

    Four point probe

  • Atomic-Force Microscope photograph

    Atomic-Force Microscope (AFM 5500 Agilent/Nano observer CSI Instruments)

  • X-ray reflectivity photograph

    X-ray reflectivity/diffractometry (X'pert PRO by PANalytical)

  • Quantum Design PPMS

    Quantum Design PPMS

  • Dual-beam FIB/SEM - FEI Helios Nanolab / FEI Helios 450S

    Dual-beam FIB/SEM - FEI Helios Nanolab / FEI Helios 450S

CIC nanoGUNE
Tolosa Hiribidea, 76
E-20018 Donostia – San Sebastian
+34 943 574 000
external.services@nanogune.eu
www.nanogune.eu

External Services Menu

  • Home
  • External services
    • Who we are
    • Latest news
    • Contact
  • How we work
  • Specialization Areas
    • Nano/micro fabrication
    • Physical/chemical characterization
    • Structural-morphology characterization
  • Equipment
    • Bookings
    • Characterization Platform
    • Sample Fabrication Platform

Menú tools external

  • Nano/micro fabrication
    • Functional Coatings
    • Micro/nano fabrication
    • Surface structuring
    • Thin layers analysis
  • Physical/chemical characterization
    • Micro - nano mechanical analysis
    • Magnetic characterization
    • Chemical characterization
    • Surface composition analysis
    • Electrical characterization
  • Structural-morphology characterization
    • Surface morphology
    • Structural characterization
    • In situ electron microscopy
    • Micro/Nano Tomography, 3D electron microscopy

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