X-ray reflectivity and diffractometry (XRR-XRD)

What we can offer:
Layer crystalllinity and thickness analysis
Grain size analysis
Epitaxial relations and interface intermixing studies
Empyrean Malvern-Panalytical
Possibility:
- Thin-film coatings characterization (thickness, density, interface roughness)
- Crystallographic phase identification and crystal grain size measurements
- Phase identification and quantification
- Pore size distribution
Interesting for (with the system):
Material science industry, biotech, automotive industry, iron ad steel industry, metallurgy, machine tool manufacturers, microelectronics and microsystems industry.
Tags
XRD
XRR
thickness
crystallography