Spectroscopic ellipsometer (GES5 spectroscopic-ellipsometer SEMILAB)
What we can offer:
- Non-destructive measurement of a wide range of layer thicknesses and material optical properties.
To measure optical properties at wavelengths from 230 to 900 nm.
To measure at different incidence angles (from 40° to 77°).
To perform automatic multipoint measurements using a xy sample stage movement.
To perform spectroscopic photometry measurements (transmittance and reflectance).
To extract valuable optical information by automatic comparison, using a specialized software, of the measured data to the reference data available at big data-bases.
Interesting for (with the system):
- Material science industry, optoelectronic and optical industry, photovoltaic, semiconductors…