X-ray reflectivity/diffractometry (X'pert PRO by PANalytical)

X-ray reflectivity and diffractometry (XRR-XRD)
X-ray reflectivity photograph

What we can offer:

Layer crystalllinity and thickness analysis

Grain size analysis

Epitaxial relations and interface intermixing studies

Possibility:

  • Thin-film coatings characterization (thickness, density, interface roughness)

  • Crystallographic phase identification and crystal grain size measurements

  • Phase identification and quantification

  • Pore size distribution

 

Interesting for (with the system):

Material science industry, biotech, automotive industry, iron ad steel industry, metallurgy, machine tool manufacturers, microelectronics and microsystems industry.

Tags
XRD
XRR
thickness
crystallography

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