X-ray reflectivity/diffractometry (X'pert PRO by PANalytical)

X-ray reflectivity and diffractometry (XRR-XRD)
X-ray reflectivity photograph

What we can offer:

Layer crystalllinity and thickness analysis

Grain size analysis

Epitaxial relations and interface intermixing studies

Possibility:

  • Thin-film coatings characterization (thickness, density, interface roughness)

  • Crystallographic phase identification and crystal grain size measurements

  • Phase identification and quantification

  • Pore size distribution

 

Interesting for (with the system):

Material science industry, biotech, automotive industry, iron ad steel industry, metallurgy, machine tool manufacturers, microelectronics and microsystems industry.

Tags
XRD
XRR
thickness
crystallography

Do you want more information?

datos
question
bottom

Anti spam: Write the result of adding eight and the number six in letters

Basic information on data protection
Data controller ASOCIACIÓN CENTRO DE INVESTIGACIÓN COOPERATIVA EN NANOCIENCIAS – CIC nanoGUNE
Purposes Process and manage your information request.
Rights You have the right to withdraw your consent at any time, oppose their processing, access, rectify and erase the data, in addition to other rights, by writing to CIC nanoGUNE via post or to the email address nano@nanogune.eu.
Additional information You can consult additional, detailed information on Data Protection in the Privacy Policy section.
By clicking on “Submit” I consent to the processing of my data under the terms indicated