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Metalofullerenes inside SWNT

Metalofullerenes inside SWNT

High resolution image of ((Ho3N)@C80)@SWNT compound (sample is a courtesy of Prof. A.Khlobystov).
The technique used is an aberration corrected High Resolution TEM at decreased accelerating voltages that can be applied for direct imaging of molecules.

Equipment
High resolution transmission electron microscope (HRTEM)
Keyword
Aberration correction
Low voltage
Research group
Electron Microscopy

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External Services Menu

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  • External services
    • Who we are
    • Latest news
    • Contact
  • How we work
  • Specialization Areas
    • Nano/micro fabrication
    • Physical/chemical characterization
    • Structural-morphology characterization
  • Equipment
    • Characterization Platform
    • Sample Fabrication Platform
    • Bookings

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  • Nano/micro fabrication
    • Functional Coatings
    • Micro/nano fabrication
    • Surface structuring
    • Thin layers analysis
  • Physical/chemical characterization
    • Magnetic characterization
    • Chemical characterization
    • Surface composition analysis
    • Electrical characterization
  • Structural-morphology characterization
    • Surface morphology
    • Structural characterization
    • In situ electron microscopy
    • Micro/Nano Tomography, 3D electron microscopy

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