Atomic-Force Microscope
![Atomic-Force Microscope (AFM 5500 Agilent/Nano observer CSI Instruments) Atomic-Force Microscope (AFM 5500 Agilent/Nano observer CSI Instruments)](/sites/default/files/atomic_force_microscope_agilent_5500-2-min_0.jpg)
What we can offer:
Reliable and replicable high-quality topography and magnetic images with the highest nanoscale resolution at up to 250 ºC and in-situ magnetic field.
Possibility:
Topographical analysis of a wide variety of materials with nanoscale lateral resolution and sub-nm height resolution.
Interesting for (with the system):
Material science, biology, pharmaceutics…
Tags
Topography
Nanoscale
AFM
height profile