What we can offer:

• Non-destructive measurement of a wide range of layer thicknesses and material optical properties.

Possibility:

• To measure optical properties at wavelengths from 230 to 900 nm.

• To measure at different incidence angles (from 40° to 77°).

• To perform automatic multipoint measurements using a xy sample stage movement.

• To perform spectroscopic photometry measurements (transmittance and reflectance).

• To extract valuable optical information by automatic comparison, using a specialized software, of the measured data to the reference data available at big data-bases.

Interesting for (with the system):

• Material science industry, optoelectronic and optical industry, photovoltaic, semiconductors…