X-ray reflectivity and diffractometry (XRR-XRD)
What we can offer:
Layer crystalllinity and thickness analysis
Grain size analysis
Epitaxial relations and interface intermixing studies
Possibility:
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Thin-film coatings characterization (thickness, density, interface roughness)
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Crystallographic phase identification and crystal grain size measurements
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Phase identification and quantification
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Pore size distribution
Interesting for (with the system):
Material science industry, biotech, automotive industry, iron ad steel industry, metallurgy, machine tool manufacturers, microelectronics and microsystems industry.
Tags
XRD
XRR
thickness
crystallography