What we can offer (with the system):
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SEM – morphological surface analysis
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STEM (Scanning Transmission Electron Microscopy) – resolution < 1 nm at 30 kV
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ESEM – non conducting samples without any coating Imaging of wet samples and liquid water
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Cryogenic cooling stage
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Possibility to inject liquid by manipulators while imaging
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In-situ electrical measurements – 3 probes, probing current 10 nA to 100 mA, probing max. voltage 100 V and probing resistance 7 Ω
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Extra-large high-resolution surface imaging (up to cm2 areas with nm resolution)
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EDX – Energy dispersive x-ray spectroscopy
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In-situ force measurement system
Interesting for (with the system):
Material science, microelectronics and semiconductors, automotive, laboratory test facilities, microscopy laboratories, machine tool manufacturers, iron and steel industry, life science, objects of cultural heritage examination, energy and petrochemical companies