Electrical characterization

What we can offer:

Resistance versus temperature (2K - 400K).
I(V) and V(I) curves at different temperatures (2K - 400K) applied filed up to 9T.
Magneto resistance measurements.

Possibility to:

Mapping of local conductivity and identification of materials in semiconductor devices and/or nanowires.
Molecular disorder in organic semiconductors.
Detailed electrical properties characterization in newly synthesized or modified materials (thin films, particles...).
Sheet-resistance measurement of thin films and surfaces.
Nano/micro electronic-devices complete characterization.

Interesting for:

Semiconductor industry, biotech, materials-science industry, iron ad steel industry, metallurgy, machine-tool manufacturers, microelectronics and microsystems companies...

Physical/chemical characterization

Tools

Probe station

Near-field microscope, s-SNOM (NeaSpec)

Scattering-type near-field microscope (NeaSpec)

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